The regions of incident electron energy E₀ and absorber atomic number Z to which EMID is applicable are given below for each parameter. The formulas and the algorithm of EMID can also be used outside the energy regions given, possibly down to a half of the lower limit and up to twice the upper limit, if a moderate errors are tolerated.

D_cp: charge deposition by primary electrons

E₀ = 0.5-24 MeV, Z = 4-92; accuracy not evaluated numerically (Ref. 1; Ref. 8 for the extrapolated range).

D_e: energy deposition

E₀ = 0.1-20 MeV, Z = 4-92; rms deviation = 0.7-2.5% (Ref. 10).

D_eb: Energy deposition via bremsstrahlung

E₀ = 0.1-100 MeV, Z = 4-92; rms deviation relative to the total energy deposition < or = 2.0% (Ref. 7).

D_ec: energy deposition via collision

E₀ = 0.1-20 MeV, Z = 4-92; rms deviation is about 0.7-2.5% (Ref. 10).

h_E: energy-reflection ratio of electrons

E₀ = 0.005-100 MeV, Z = 4-92; accuracy not evaluated numerically, but agreement with ITS Monte Carlo results are satisfying when h_pE is larger than 0.005 (the formula for the number-reflection ratio in Ref. 4 multiplied by the formula for the fractional energy of reflected electrons in Ref. 13).

h_pE: energy-reflection ratio of photons

E₀ = 0.1-100 MeV, Z = 4-92; rms deviation = 7.2% (Ref. 5).

h_N: number-reflection ratio of electrons

E₀ = 0.001-22 MeV, Z = 4-92; rms deviation = 5.6% (Ref. 4).

k: number-transmission ratio

- For normal incidence, E₀ = 0.008-30 MeV, Z = 4-82; the average of rms deviation = 3.4% with respect to experimental data published (Ref. 2, the formula is also in Ref. 9).
- For non-normal incidence, E₀ = 0.5-10 MeV, Z=13, angle of incidence up to 75 deg; rms absolute deviation is about 0.03 (Ref. 3, the formula is also given in Ref. 12).

r₀: continuous slowing-down approximation range

E₀ = 0.1-100 MeV, Z = 4-92; rms deviation = 0.7%, maximum deviation = 1.5% with respect to EPSTAR database (Ref. 8); can be used down to 0.01 MeV with moderate accuracy.

R_av: average reach

E₀ = 0.008-30 MeV, Z = 4-82; accuracy not evaluated numerically (Ref. 9).

R_ex: extrapolated range

E₀ = 0.1-100 MeV, Z = 4-92; rms deviation = 0.9%, maximum deviation = 2.0% with respect to ITS Monte Carlo results (Ref. 8); can be used down to 0.01 MeV with moderate accuracy.

z_av: average penetration depth

E₀ = 1-50 MeV, Z = 4-92; maximum deviation < or = 2.1% (Ref. 11 with the formula for r₀in Ref. 8); for phantom materials used in medical dosimetry, another formula with higher accuracy is also proposed in Ref. 11.